Considerations on the XPS Analysis of 2H‐TaS<sub>2</sub> (0001)
Considerations on the XPS Analysis of 2H‐TaS2 (0001)
Authors (4): C. Drivas, C. R. A. Catlow, M. A. Isaacs, G. Kyriakou
Themes: New Catalysts
DOI: 10.1002/sia.70013
Citations: 0
Pub type: journal-article
Pub year: 2025

Publisher: Wiley

Issue: 10

License: [{"start"=>{"date-parts"=>[[2025, 8, 31]], "date-time"=>"2025-08-31T00:00:00Z", "timestamp"=>1756598400000}, "content-version"=>"vor", "delay-in-days"=>0, "URL"=>"http://creativecommons.org/licenses/by/4.0/"}]

Publication date(s): 2025/10 (print) 2025/08/31 (online)

Pages: 802-808

Volume: 57 Issue: {"issue"=>"10", "published-print"=>{"date-parts"=>[[2025, 10]]}}

Journal: Surface and Interface Analysis

Link: [{"URL"=>"https://analyticalsciencejournals.onlinelibrary.wiley.com/doi/pdf/10.1002/sia.70013", "content-type"=>"unspecified", "content-version"=>"vor", "intended-application"=>"similarity-checking"}]

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ABSTRACTA 2H‐TaS2 (0001) single crystal was studied with XPS. The quantification and fitting procedures for this material are discussed in detail. It is shown that conventional approaches for data deconvolution fail, and an in‐depth analysis utilising theoretical sensitivity factors and taking into account the shake‐up and loss structures is needed to produce accurate results. Additionally, the inherent asymmetry of the Ta and S peaks is highlighted, and appropriate line shapes are determined.

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